One-shot learning for the complex dynamical behaviors of weakly nonlinear forced oscillators

arXiv cs.LG / 4/17/2026

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Key Points

  • The paper introduces a one-shot learning approach to predict global frequency-response curves of nonlinear forced oscillators from only a single excitation time history.
  • It presents MEv-SINDy, which learns the governing equations for non-autonomous, multi-frequency systems by using Generalized Harmonic Balance (GHB) to transform complex responses into slow-varying evolution equations.
  • The method is validated on two MEMS case studies—a nonlinear beam resonator and a MEMS micromirror—demonstrating accurate predictions across excitation levels.
  • The results indicate strong performance for capturing nonlinear characteristics such as softening/hardening behavior and jump phenomena, while greatly reducing data acquisition requirements.
  • Overall, the study targets a core engineering challenge by combining physics-informed sparse identification with one-shot data efficiency for microsystem characterization and design.

Abstract

Extrapolative prediction of complex nonlinear dynamics remains a central challenge in engineering. This study proposes a one-shot learning method to identify global frequency-response curves from a single excitation time history by learning governing equations. We introduce MEv-SINDy (Multi-frequency Evolutionary Sparse Identification of Nonlinear Dynamics) to infer the governing equations of non-autonomous and multi-frequency systems. The methodology leverages the Generalized Harmonic Balance (GHB) method to decompose complex forced responses into a set of slow-varying evolution equations. We validated the capabilities of MEv-SINDy on two critical Micro-Electro-Mechanical Systems (MEMS). These applications include a nonlinear beam resonator and a MEMS micromirror. Our results show that the model trained on a single point accurately predicts softening/hardening effects and jump phenomena across a wide range of excitation levels. This approach significantly reduces the data acquisition burden for the characterization and design of nonlinear microsystems.