Multigrain-aware Semantic Prototype Scanning and Tri-Token Prompt Learning Embraced High-Order RWKV for Pan-Sharpening
arXiv cs.CV / 4/17/2026
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Key Points
- The paper introduces a multigrain-aware semantic prototype scanning approach for pan-sharpening to reduce RWKV’s positional bias by using semantic grouping (via locality-sensitive hashing) and context-aware token reordering.
- It proposes tri-token prompt learning for RWKV, combining a global token, cluster-derived prototype tokens, and a learnable register token to improve semantic priors while suppressing noisy intermediate representations.
- To better preserve spatial detail, the method adds an invertible multi-scale Q-shift feature transformation and uses center-difference convolution to inject high-frequency information without heavy parameter growth.
- Experiments reported in the abstract indicate the proposed approach outperforms existing methods for pan-sharpening.


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